Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology

The EPFL is looking for a motivated postdoctoral researcher to work on high-throughput imaging of static structural defects in semiconductor devices. The successful candidate will develop an acquisition and reconstruction framework that leverages known design information to detect defects with minimal X-ray measurements. This position offers the opportunity to work with existing experimental datasets and perform experiments at the Swiss Light Source synchrotron. Candidates should have a PhD in physics, engineering, or computer science, along with strong programming skills in Python and experience in inverse problems and 3D reconstruction methods. The position is fully funded for two years, with potential for extension.