Ecole Polytechnique Federale de Lausanne
Posted: 25 August 2026 - Lausanne, Switzerland
The Laboratory for Nanoscale X-ray Metrology at EPFL is looking for a motivated postdoctoral researcher to develop time-resolved imaging methods for semiconductor reliability. The role involves creating an acquisition and reconstruction framework to detect nanoscale changes in microchip samples, focusing on algorithm development and conducting experiments at synchrotron facilities. Candidates should have a PhD in physics, engineering, or computer science, and experience with inverse problems and 3D reconstruction methods. The position is funded for two years with the possibility of extension, offering mentorship and opportunities for professional development.